NAGARAJAN, R.; YAACOB, Sazali; PANDIAN, Paulraj; RIZON, Mohamed; M.KARTHIGAYAN, Nan. FEATURE EXTRACTION METHODS FOR IC CHIP MARKING INSPECTION-A COMPARISON. Iraqi Journal for Electrical and Electronic Engineering, [S. l.], v. 2, n. 1, p. 7–18, 2006. DOI: 10.37917/ijeee.2.1.2. Disponível em: https://ijeee.edu.iq/ijeee/article/view/103. Acesso em: 8 dec. 2025.