Nagarajan, R., Yaacob, S., Pandian, P., Rizon, M., & M.Karthigayan, nan. (2006). FEATURE EXTRACTION METHODS FOR IC CHIP MARKING INSPECTION-A COMPARISON. Iraqi Journal for Electrical and Electronic Engineering, 2(1), 7-18. https://doi.org/10.37917/ijeee.2.1.2